News

FEMTOMETRIX

Femtometrix®(R) Closes B-Round of Financing.

Femtometrix has closed its Series-B round of equity Financing. The company raised approximately $12 M in a round syndicated with SK hynix and NASA/JPL.

VISIT US!

Come visit us at FCMN 2022, in Monterey, California!

Femtometrix has been accepted for poster submission to FCMN 2022. We will be co-presenting with Tokyo Electron (TEL) the results from our recent study into utilizing the F3x process control tool to make sub-nanometer measurements of critical dimensions in advanced semiconductor devices.

SAMSUNG

Femtometrix® Closes Series A Financing Round Led By Samsung Ventures

At the end of August, 2016, Femtometrix completed its first round of equity financing in a deal led by Samsung's Venture Division. The round included financing from other related parties.

BOEING

Femtometrix® announces license agreement with Boeing

Solid State Technology - Femtometrix®, a developer of non-destructive optical metrology systems, announced today that it has entered into a patent and technology license agreement with The Boeing Company. This license allows Femtometrix® to include new, enhanced metrology capabilities into its non-destructive optical metrology products, enabling enhanced yield and reliability at all process nodes.

A prime concern for semiconductor fabricators is the inability to test starting materials in a comprehensive non-destructive manner prior to use. Undetected defects in semiconductor starting materials cause device failure and are a critical problem in the IC (integrated circuit) industry. Femtometrix® has developed a novel quality assurance tool for semiconductor materials metrology that identifies yield and reliability killing defects prior to the final manufacture of the end product.

Femtometrix® non-destructive technique is a contactless, optical characterization method for characterizing surfaces, interfaces, thin films, as well as bulk properties of materials. These metrology systems enable fabs to improve yield by detecting Non-Visual Defects optically. Such defects include surface and buried metallic and organic contamination, as well as other yield killing non- uniformities that cannot be seen by other in-line tools.

Alon Raphael, President of Femtometrix® stated, "We are excited to be using Boeing's technology to create an optical in-line solution with high throughput for Non-Visual Defects to meet the advancing needs of device fabricators worldwide."

"When we can redeploy our technology to help another company accelerate their innovation, we consider that a success," said Peter Hoffman, Boeing Vice President of Intellectual Property Management.

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SEMI

ASMC 2018 APRIL 30 - MAY 3

Femtometrix® speaks at the SEMI Advanced Semiconductor Manufacturing Conference (ASMC 2018)

Please visit us on Tuesday, May 1st 3:10pm, Session 4 - Advanced Metrology I, at the 2018 Advanced Semiconductor Manufacturing Conference (ASMC) in Saratoga Springs, New York for our talk,

"Detection of Thermal Donors from Electrically Active Interstitial Oxygen by Optical Second Harmonic Generation"

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